All crystalline phases in the sample can be determined by one measurement. There are also extended possibilities for diffraction measurements at the same time controlling the ambient temperature (from liquid nitrogen to 1600 oC) and the surrounding environment (high vacuum can be used or the desired amount of gas (suitable for many gases) up to a maximum pressure of 5 bar).
The device is designed for non-destructive analysis of all types of materials, powder and thin coating samples. The device can simultaneously detect all the crystalline phases present in the sample without any time consuming preparatory work. The device can be used to test specimens that, in general, have several different phases of different shapes and sizes crystallites.
